Towards A Model-based Prognostics Methodology for Electrolytic Capacitors: A Case Study Based on Electrical Overstress Accelerated Aging

Jose R. Celaya, Chetan Kulkarni, Gautam Biswas, and Kai Goebel
Publication Target: 
IJPHM
Publication Issue: 
2
Submission Type: 
Full Paper
Supporting Agencies (optional): 
NASA
AttachmentSizeTimestamp
ijphm_12_004.pdf1.84 MBFebruary 20, 2013 - 5:55pm

This paper presents a model-driven methodology for predict- ing the remaining useful life of electrolytic capacitors. This methodology adopts a Kalman filter approach in conjunction with an empirical state-based degradation model to predict the degradation of capacitor parameters through the life of the capacitor. Electrolytic capacitors are important components of systems that range from power supplies on critical avion- ics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their critical role in the system, they are good candidates for component level prognostics and health management. Prognostics provides a way to assess remain- ing useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. This paper proposes and empirical degradation model and discusses experimental results for an accelerated aging test performed on a set of identical capacitors subjected to electrical stress. The data forms the basis for developing the Kalman-filter based remaining life prediction algorithm.

Publication Year: 
2012
Publication Volume: 
3
Publication Control Number: 
004
Page Count: 
19
Submission Topic Areas: 
Component-level PHM
Model-based methods for fault detection, diagnostics, and prognosis
PHM for electronics
Physics of failure
Verification and validation
Submitted by: 
  
 
 
 

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