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CLASS:PUBLIC
CREATED:20110908T231705Z
DESCRIPTION:8:00AM–9:50AM Paper Session 7B – Electronics PHM II\nKarl R
eichard\n(Penn State University/ARL\, USA) Verdun/ Lachine \n Symbolic Dy
namics and Analysis of Time Series Data for Diagnostics of a dc-dc Forward
Converter\nGregory Bower\n(Pennsylvania State University\, USA) \n A M
odel-based Prognostics Methodology for Electrolytic Capacitors Based on El
ectrical Overstress Accelerated Aging\nJosé Celaya\n(SGT Inc./NASA Ames R
esearch Center\, USA) \n Prognostics of Power MOSFETs under Thermal Str
ess Accelerated Aging using Data-Driven and Model-Based Methodologies\nJos
é Celaya\n(SGT Inc./NASA Ames Research Center\, USA) \n Electronics PHM
Issues Panel \n\n
DTEND:20110929T135000Z
DTSTAMP:20110908T231705Z
DTSTART:20110929T120000Z
LAST-MODIFIED:20110908T231705Z
LOCATION:Verdun/ Lachine
PRIORITY:5
SEQUENCE:0
SUMMARY;LANGUAGE=en-us:Paper Session 7B & Panel - Electronics PHM II
TRANSP:OPAQUE
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X-ALT-DESC;FMTTYPE=text/html:\n\n\n\n\n\n\n\n\n8:00AM–9:50
AM \; \; Pap
er Session 7B – Electronics PHM II<
/SPAN>
\nKarl Reichard
\n(Penn State University/ARL\, USA) \;&nb
sp\; \; \; \; \; \;
\n \; \;
\; \; \; \; Symbolic
Dynamics and Analysis of Time Series Data for Diagnostics of a dc-dc Forw
ard Converter
\nGregory Bower
\n(Pennsylvania S
tate University\, USA) \; \; \; \; \; \; \; \; \;<
SPAN LANG="en-us">
\n \; \; \; \; \;
\; A Model-based Prognostics Methodol
ogy for Electrolytic Capacitors Based on Electrical Overstress Accelerated
Aging
\nJosé Celaya
\n(SGT Inc./NASA Ames Res
earch Center\, USA) \; \; \; \; \;
\; \; \; \; \; \;&nbs
p\;
\n \; \; \;&
nbsp\; \; \; Prognostics of P
ower MOSFETs under Thermal Stress Accelerated Aging using Data-Driven and
Model-Based Methodologies
\nJosé Celaya
\n<
/SPAN>(SGT
Inc./NASA Ames Research Center\, USA) \; \; \;
\; \; \;<
/SPAN> \; \; \
; \; \; \;
\n
\n
\n\n\
n
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