accelerated testing

Jose Celaya, Nishad Patil, Sankalita Saha, Phil Wysocki, and Kai Goebel
Submission Type: 
Technical Brief

Understanding aging mechanisms of electronic components is of extreme importance in the aerospace domain where they are part of numerous critical subsystems including avionics. In particular, power MOSFETs are of special interest as they are involved in high voltage switching circuits such as drivers for electrical motors. With increased use of electronics in aircraft control, it becomes more important to understand the degradation of these components in aircraft specific environments.

Submission Keywords: 
accelerated testing
applications: electronics
electronic equipment
electronic prognostic methods
electronic systems
electronics PHM
field effect transistors (FET)
remaining useful life (RUL)
run-to-failure data
semiconductor device reliability
sensor fusion
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Bhaskar Saha and Kai Goebel
Submission Type: 
Full Paper

This paper presents an empirical model to describe battery behavior during individual discharge cycles as well as over its cycle life. The basis for the form of the model has been linked to the internal processes of the battery and validated using experimental data. Subsequently, the model has been used in a Particle Filtering framework to make predictions of remaining useful life for individual discharge cycles as well as for cycle life. The prediction performance was found to be satisfactory as measured by performance metrics customized for prognostics.

Submission Keywords: 
accelerated testing
batteries
battery health algorithms
battery power management
lithium-ion batteries
particle filtering
physics of failure
remaining useful life (RUL)
state of charge estimation
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