It is an inescapable truth that no matter how well a system is designed it will degrade, and if degrading parts are not repaired or replaced the system will fail. Avoiding the expense and safety risks associated with system failures is certainly a top priority in many systems; however, there is also a strong motivation not to be overly cautious in the design and maintenance of systems, due to the expense of maintenance and the undesirable sacrifices in performance and cost effectiveness incurred when systems are over designed for safety.

Battery Health Management (BHM) is a core enabling technology for the success and widespread adoption of the emerging electric vehicles of today. Although battery chemistries have been studied in detail in literature, an accurate run-time battery life prediction algorithm has eluded us. Current reliability based techniques are insufficient to manage the use of such batteries when they are an active power source with frequently varying loads in uncertain environments.

The ability to utilize prognostic system health information in operational decision making, especially when fused with information about future operational, environmental, and mission requirements, is becoming desirable for both manned and unmanned aerospace vehicles. A vehicle capable of evaluating its own health state and making (or assisting the crew in making) decisions with respect to its system health evolution over time will be able to go further and accomplish more mission objectives than a vehicle fully dependent on human control.

An approach for predicting remaining useful life of power MOSFETs (metal oxide field effect transistor) devices has been developed. Power MOSFETs are semiconductor switching devices that are instrumental in electronics equipment such as those used in operation and control of modern aircraft and spacecraft. The MOSFETs examined here were aged under thermal overstress in a controlled experiment and continuous performance degradation data were collected from the accelerated aging experiment. Die-attach degradation was determined to be the primary failure mode.

A remaining useful life prediction methodology for electrolytic capacitors is presented. This methodology is based on the Kalman filter framework and an empirical degradation model. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their criticality in electronics subsystems they are a good candidate for component level prognostics and health management.

The success of model-based approaches to systems health management depends largely on the quality of the underlying models. In model-based prognostics, it is especially the quality of the damage progression models, i.e., the models describing how damage evolves as the system operates, that determines the accuracy and precision of remaining useful life predictions. Several common forms of these models are generally assumed in the literature, but are often not supported by physical evidence or physics-based analysis.

Within the area of systems health management, the task of prognostics centers on predicting when components will fail. Model-based prognostics exploits domain knowledge of the system, its components, and how they fail by casting the underlying physical phenomena in a physics-based model that is derived from first principles. Uncertainty cannot be avoided in prediction, therefore, algorithms are employed that help in managing these uncertainties.

With the advent of the next generation of aerospace systems equipped with fly-by-wire controls, electro-mechanical actuators (EMA) are quickly becoming components critical to safety of aerospace vehicles. Being relatively new to the field, however, EMA lack the knowledge base compared to what is accumulated for the more traditional actuator types, especially when it comes to fault detection and prognosis.

This paper presents research results dealing with power MOSFETs (metal oxide semiconductor field effect transistor) within the prognostics and health management of electronics. Experimental results are presented for the identification of the on-resistance as a precursor to failure of devices with die-attach degradation as a failure mechanism. Devices are aged under power cycling in order to trigger die-attach damage.

One of the key motivating factors for using particle filters for prognostics is the ability to include model parameters as part of the state vector to be estimated. This performs model adaptation in conjunction with state tracking, and thus, produces a tuned model that can used for long term predictions. This feature of particle filters works in most part due to the fact that they are not subject to the “curse of dimensionality”, i.e. the exponential growth of computational complexity with state dimension.