Degredation Modeling and Remaining Useful Life Prediction of Electrolytic Capacitors under Thermal Overstress Condition Using Particle Filters

Hamed Khorasgani, Chetan Kulkarni, Gautam Biswas, Jose R. Celaya, and Kai Goebel
Submission Type: 
Full Paper
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phmc_13_054.pdf290.89 KBSeptember 14, 2013 - 1:07am

Prognostic and remaining useful life (RUL) prediction problem for electrolyte capacitors under thermal overstress condition is investigated in this paper. In the first step the degradation process is modeled as a physics of failure process. All of the relevant parameters and states of the capacitor are considered during the degradation process. A particle filter approach is utilized to derive the dynamic form of the degradation model and estimate the current state of capacitor health.
This model is then used to get more accurate estimation of the Remaining Useful Life (RUL) of the capacitors as they are subjected to the thermal stress conditions. The paper includes an experimental study, where the degradation of a set of identical capacitors under thermal overstress condition is studied to demonstrate and validate the performance of the degradation modeling approach.

Publication Year: 
2013
Publication Volume: 
4
Publication Control Number: 
054
Submission Topic Areas: 
Model-based methods for fault detection, diagnostics, and prognosis
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