Remaining Useful Lifetime (RUL) - Probabilistic Predictive Model

Ephraim Suhir
Publication Target: 
IJPHM
Publication Issue: 
2
Submission Type: 
Technical Brief
AttachmentSizeTimestamp
ijPHM_11_013.pdf189.94 KBDecember 4, 2011 - 11:05pm

Reliability evaluations and assurances cannot be delayed until the device (system) is fabricated and put into operation. Reliability of an electronic product should be conceived at the early stages of its design; implemented during manufacturing; evaluated (considering customer requirements and the existing specifications), by electrical, optical and mechanical measurements and testing; checked (screened) during manufacturing (fabrication); and, if necessary and appropriate, maintained in the field during the product’s operation Simple and physically meaningful probabilistic predictive model is suggested for the evaluation of the remaining useful lifetime (RUL) of an electronic device (system) after an appreciable deviation from its normal operation conditions has been detected, and the increase in the failure rate and the change in the configuration of the wear-out portion of the bathtub has been assessed. The general concepts are illustrated by numerical examples. The model can be employed, along with other PHM forecasting and interfering tools and means, to evaluate and to maintain the high level of the reliability (probability of non-failure) of a device (system) at the operation stage of its lifetime.

Publication Year: 
2011
Publication Volume: 
2
Publication Control Number: 
013
Page Count: 
5
Submission Keywords: 
remaining useful lifetime
probabilistic approach
Submission Topic Areas: 
Data-driven methods for fault detection, diagnosis, and prognosis
Submitted by: 
  
 
 
 

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