Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress

Chetan S Kulkarni, Jose R. Celaya, Kai Goebel, and Gautam Biswas
Submission Type: 
Full Paper
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phmce_12_019.pdf317.11 KBJune 12, 2012 - 12:18pm

Electrolytic capacitors are used in several applications ranging from power supplies on safety critical avionics equipment to power drivers for electro-mechanical actuators. This makes them good candidates for prognostics and health management research. Prognostics provides a way to assess remaining useful life of components or systems based on their current state of health and their anticipated future use and operational conditions. Past experiences show that capacitors tend to degrade and fail faster under high electrical and thermal stress conditions that they are often subjected to during operations. In this work, we study the effects of accelerated aging due to thermal stress on different sets of capacitors under different conditions. Our focus is on deriving first principles degradation models for thermal stress conditions. Data collected from simultaneous experiments are used to validate the desired models. Our overall goal is to derive accurate models of capacitor degradation, and use them to predict performance changes in DC-DC converters.

Publication Year: 
2012
Publication Volume: 
3
Publication Control Number: 
019
Page Count: 
9
Submission Keywords: 
accelerated failure time model
electronics PHM; Capacitors; Physics based models; Capacitance; Accelerated aging
Submission Topic Areas: 
Model-based methods for fault detection, diagnostics, and prognosis
PHM for electronics
Physics of failure
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