Prognostics Method for Analog Electronic Circuits

Arvind Sai Sarathi Vasan, Bing Long, and Michael Pecht
Submission Type: 
Full Paper
AttachmentSizeTimestamp
phmc_12_130.pdf224.53 KBJune 4, 2012 - 3:34pm

Analog electronic circuits are an integral part of many industrial systems. Failure in such analog circuits during field operation can have severe economic implications. The presence of an expert system that can provide advance warnings on circuit failures can minimize the downtime and improve the reliability of electrical systems. Through successive refinement of circuit’s response to a sweep signal, features are extracted for fault prognosis. From the extracted features, a fault indicator is developed. An empirical model is developed based on the degradation trend exhibited by the fault indicator. Particle filtering approach is used for model adaptation and remaining useful performance estimation. This framework is completely automated and has the merit of implementation simplicity. The proposed framework is demonstrated on two analog filter circuits.

Publication Year: 
2012
Publication Volume: 
3
Publication Control Number: 
130
Page Count: 
7
Submission Keywords: 
Analog circuits
prognostic method
Submission Topic Areas: 
PHM for electronics
Submitted by: 
  
 
 
 

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